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1606 Central Campus Mall, Boulder, CO 80309

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Title: Correlated Atomic Force Microscopy for Nanoscale Structure-Property Characterization

Abstract: A wide variety of scanning probe microscopy (SPM) modes based on atomic force microscopy (AFM) have been developed to characterize the nanoscale mechanical, electrical, magnetic, electrochemical, and thermal properties of surfaces. As a result, SPM enjoy widespread use in the surface characterization of materials. However, SPM modes for typical instruments do not provide information on crystal structure, chemical composition or optical properties. This talk will show how this limitation can be overcome through sub-micron precision co-localization of advanced SPM modes with other analytical techniques such as scanning electron microscopy (SEM), Raman microscopy, and/or fluorescence-based super-resolution optical microscopy. In particular, co-localization of Kelvin probe force microscopy (KPFM) with SEM, energy dispersive spectroscopy (EDS), and electron backscatter diffraction (EBSD) has enabled correlation of surface Volta potentials with the composition and orientation of microstructural phases present in metal alloys. Additionally, the recently developed technique of photothermal AFM-IR, which simultaneously couples AFM and infrared spectroscopy to enable chemical identification at the nanoscale, in being used to gain insights into area-selective atomic layer deposition and device fabrication.